Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems): 12
by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III
ISBN 13: 9780471731726
Format: Hardcover (624 pages) Publisher: Wiley-IEEE Press Published: 04 Sep 2009
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